Radiation and its Effects on Components and Systems
September 16-20th, 2019
The RADECS Conference is the annual European scientific and industrial forum on the effects of radiation on electronic and photonic materials, devices, circuits, sensors and systems where scientists and engineers exchange on the latest progresses and results.
RADECS 2019 is organized by the Institute of Electronics and Systems of the University of Montpellier.
Alter Technology will participate in the Industrial Exhibition and with these papers:
"TID Radiation Effects of 1Gb COTS NOR Flash Memories for the ESA JUICE Mission"
Authors: S. Vargas-Sierra, B. Tanios, J.J. González-Luján, F. Tilhac, M. Domínguez, C. Poivey
Alter Technology TÜV NORD & European Space Agency (ESTEC)
Abstract— This work presents the comparative study of the TID radiation sensitivity of three COTS NOR Flash memories for the ESA JUpiter ICy moons Explorer (JUICE) Mission.
and
"Characterisation of the DARE180U MOSFET Channel Geometry TID Radiation Sensitivity"
Authors: R. Jansen, B. Glass, C. Boatella-Polo, G. Thys, S. Verhaegen, G. Franciscatto, J. Wouters, D. Lambrichts, S. Vargas-Sierra, J. Gonzalez Lujan
Abstract—The design of radiation tolerant mixed-signal circuits is confronted with either RHBD transistors that are not supported by the foundry monitoring and modelling or the inaccurate estimate of the radiation effects of the foundry supported devices. A test-vehicle has been created that includes for all the DARE180U technology devices types and channel geometries test structures to capture the electrical characterisation of the TID radiation response. The results of the measurements are presented and do allow a more accurate estimate of the TID radiation response for the mixed-signal circuits in the DARE180U technology. Furthermore, the wealth of data obtained would enable accurate modelling of the radiation TID effects in these devices.
Visit us at booth 10.
September 16-20th, 2019
RADECS 2019 will be held at the Corum Conference Center, Montpellier, France.